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A practical design of a simple retardance meter.
1Research Department, Polaroid Corporation,Cambridge, Massachusetts 02139, USA.
Applied Optics
|January 12, 2010
Summary
A novel retardance meter design allows for fast and accurate measurements of optical retardance in materials like polymeric films. This device utilizes a tilted mica crystal for direct compensation, simplifying the measurement process.
Area of Science:
- Optics and Photonics
- Materials Science
Background:
- Accurate measurement of optical retardance is crucial for applications like polarized light manipulation.
- Existing methods can be complex or time-consuming.
Purpose of the Study:
- To present a working design for a simple, direct, quick, and accurate retardance meter.
- To enable precise retardance measurement of oriented polymeric films for phase changer plates.
Main Methods:
- Developed a retardance meter based on direct compensation.
- Employed a calibrated mica crystal variably tilted about its principal planar axes.
- Incorporated design, assembly, and calibration suggestions for the device.
Main Results:
- The designed meter provides direct, quick, and accurate retardance measurements.
- The method is suitable for oriented polymeric films used in producing elliptically polarized light.
Conclusions:
- The proposed retardance meter design offers a practical solution for material characterization.
- The device simplifies the process of measuring optical retardance for specific optical applications.
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