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Updated: Jun 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Plasma spectroscopy in the vacuum ultraviolet and soft X-ray regions
Abstract:
Techniques involved in the spectroscopy of pulsed plasma sources in the vacuum ultraviolet and soft x-ray spectral regions are described in connection with recent developments in a high temperature plasma physics program. The time-integrated spectrum between 15 A and 1800 A has been analyzed using semiautomatic computer techniques for the grazing incidence portion. Time resolved absolute intensity measurements of 0 iii- O viii ion lines are described as related to recent results on energy losses and impurity content, as well as excitation rate coefficients. Broadband measurements of x-ray continuum radiation with four simultaneous detection channels are also described, and typical results of computer calculations necessary for the interpretation in terms of electron temperature are included.
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