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Multiply diffracted light in the Czerny-Turner spectrometer.

J J Mitteldorf1, D O Landon

  • 1Harvard College, Cambridge Massachusetts 02138, USA.

Applied Optics
|January 14, 2010
PubMed
Summary
This summary is machine-generated.

Stray light in spectrometers can be caused by second diffraction from reflecting optics at small grating angles. This study calculates and experimentally confirms the paths and structure of this stray light source.

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Area of Science:

  • Spectroscopy
  • Optical Engineering

Background:

  • In-plane spectrometers are susceptible to stray light.
  • Reflecting optics can contribute to stray light through secondary diffraction.

Purpose of the Study:

  • To investigate the phenomenon of stray light in spectrometers.
  • To calculate and experimentally verify the paths and structure of stray light caused by second diffraction.

Main Methods:

  • Theoretical calculation of stray light paths.
  • Experimental verification of calculated paths.

Main Results:

  • Identified a specific stray light source at small grating angles.
  • Confirmed that second diffraction by reflecting optics is responsible.
  • Characterized the paths and structure of this stray light.

Conclusions:

  • The identified stray light source can impact spectrometer performance.
  • Understanding and mitigating this stray light is crucial for accurate spectral measurements.