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Scientists typically make repeated measurements of a quantity to ensure the quality of their findings and to evaluate both the precision and the accuracy of their results. Measurements are said to be precise if they yield very similar results when repeated in the same manner. A measurement is considered accurate if it yields a result that is very close to the true or the accepted value. Precise values agree with each other; accurate values agree with a true value. Highly accurate measurements...

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Related Experiment Video

Updated: Jun 17, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

A measuring interferometer for high accuracy alignment.

|January 14, 2010

Summary

This study introduces a novel interferometer for precise flatness measurements up to 10 meters, achieving 0.1-micron accuracy. Utilizing a laser and specialized prisms, it offers easily detectable, nonlocalized fringes for advanced metrology applications.

Area of Science:

Optical metrology
Precision engineering
Interferometry

Background:

Traditional interferometers face limitations in long-distance flatness measurement.
Previous designs, like Baldwin and Whitten's (1965), utilized Kösters and Porro prisms.

Purpose of the Study:

To develop an interferometer capable of measuring deviation from a plane with high accuracy over extended distances.
To leverage modern laser technology for improved fringe detection and measurement stability.

Main Methods:

The interferometer employs a Kösters prism and a Porro prism, similar to earlier designs.
A laser serves as the light source, producing nonlocalized fringes.
An electronic fringe detector is used for monitoring output.

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The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Magnetic Tweezers for the Measurement of Twist and Torque

Magnetic Tweezers for the Measurement of Twist and Torque

Published on: May 19, 2014

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Last Updated: Jun 17, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Magnetic Tweezers for the Measurement of Twist and Torque

Magnetic Tweezers for the Measurement of Twist and Torque

Published on: May 19, 2014

Main Results:

The developed interferometer achieves a measurement accuracy of 0.1 micron.
Effective measurement is possible with an interferometer-target separation of up to 10 meters.
Nonlocalized fringes are generated, simplifying electronic monitoring.

Conclusions:

The novel interferometer design enables highly accurate flatness measurements at long ranges.
The use of a laser and electronic detection enhances the practicality and precision of the system.
This advancement offers significant potential for quality control in precision manufacturing.