Interference and Diffraction
X-ray Crystallography
IR Spectrometers
Determination of Crystal Structures
Super-resolution Fluorescence Microscopy
Phase Contrast and Differential Interference Contrast Microscopy
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Researchers converted a schlieren system into a Kraushaar interferometer using diffraction gratings. This enhanced optical instrument accurately measures surface pressures and flow fields around airfoils, showing good agreement with analytical data.
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