The xerographic properties of bi-se amorphous films

Xerographic properties were measured for vitreous bismuth-selenium films prepared by flash evaporation techniques in the 0-3 at. % Bi range. Optimum sensitivity was observed in the 1.1 at. % Bi region with broad, relatively flat spectral response from 4000 A to beyond 7000 A and quantum gain values of 0.2 to 0.06, respectively, at these wavelengths with fields of 2 x 10(5) V/cm. The variation of initial xerographic discharge rates was also determined as a function of applied field and light intensity. Mechanical flexibility approximately equivalent to that of selenium was indicated.