Immobilization method of yeast cells for intermittent contact mode imaging using the atomic force microscope

Area of Science:

• Biophysics
• Microscopy
• Cell Biology

Background:

• Atomic Force Microscopy (AFM) is crucial for live cell surface studies.
• Imaging yeast cells with AFM is challenging due to their robust cell walls and attachment difficulties.
• Existing methods limit the accessibility and detail of yeast cell surface analysis.

Purpose of the Study:

• To present a new immobilization technique for height mode AFM imaging of live yeast cells in solid media.
• To enable near-complete exposure of the yeast cell surface for detailed AFM analysis.
• To demonstrate stable and reproducible AFM imaging of yeast cells over an extended period.

Main Methods:

• Development of a novel immobilization protocol for live yeast cells on solid media.
• Application of height mode AFM imaging in intermittent contact mode.
• Long-term (10-hour) imaging to assess stability and reproducibility.

Main Results:

• Successful immobilization of live yeast cells allowing for enhanced surface exposure.
• First demonstration of height mode AFM imaging of live yeast cell surfaces in intermittent contact mode.
• Achieved stable and reproducible imaging results over a 10-hour observation period.

Conclusions:

• The new immobilization technique significantly improves AFM imaging of live yeast cells.
• This advancement facilitates detailed investigation of yeast cell growth and surface patterns.
• The method offers enhanced operational stability for long-term cellular studies.