Related Experiment Video
Updated: Jun 17, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Published on: April 4, 2017
Dependence of dispersive and birefringence properties of silicon nanowires on waveguide dimensions
Brian A Daniel1, Govind P Agrawal
1Institute of Optics, University of Rochester, Rochester, New York 14627, USA. daniel@optics.rochester.edu
Abstract:
We study numerically the dependence of dispersive and birefringence properties of silicon nanowires on waveguide dimensions and show that they have a strong geometrical dependence when nanowire dimensions become comparable to the wavelength of light inside the device. We develop a graphical method for engineering two or more dispersion parameters simultaneously and use it to demonstrate the possibility of fabricating silicon nanowires with flattened dispersion curves over a wide spectral range with normal or anomalous nominal values. We quantify polarization-mode dispersion through the differential group delay and show that it can acquire large values for properly designed nanowires. Our analysis should help in designing silicon-based photonic integrated circuits.
Related Concept Videos
Propagation of Waves
Consider a scenario where a wave propagates from a string of low linear mass density to a string of high linear mass density. In such a case, the reflected wave is out of phase with respect to the incident wave, however the...
The de Broglie Wavelength

