Electrical interfacing between neurons and electronics via vertically integrated sub-4 microm-diameter silicon probe

Takeshi Kawano1, Tetsuhiro Harimoto, Akito Ishihara

  • 1Department of Electrical and Electronic Engineering, Toyohashi University of Technology, 1-1 Tempaku-cho, Toyohashi, Aichi 441-8580, Japan. kawano@eee.tut.ac.jp

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