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Wavefront measurements of phase plates combining a point-diffraction interferometer and a Hartmann-Shack sensor
Juan M Bueno1, Eva Acosta, Christina Schwarz
1Laboratorio de Optica, Centro de Investigación en Optica y Nanofísica (CiOyN), Universidad de Murcia, Campus de Espinardo, 30100 Murcia, Spain. bueno@um.es
Applied Optics
|January 22, 2010
Summary
This study compares point diffraction interferometry (PDI) and Hartmann-Shack (HS) wavefront sensing. Both methods accurately map aberrations, with minimal differences when analyzing wavefront errors.
Area of Science:
- Optical Metrology
- Wavefront Sensing and Control
Background:
- Wavefront aberrations impact optical system performance.
- Interferometric and sensor-based techniques offer complementary approaches to aberration measurement.
Purpose of the Study:
- To compare wavefront aberration estimation between Point Diffraction Interferometry (PDI) and Hartmann-Shack (HS) wavefront sensing.
- To evaluate the combined capabilities of PDI and HS for complex phase profile measurement.
Main Methods:
- A dual optical setup integrating PDI and HS wavefront sensors was constructed.
- Phase plates were used to introduce known aberrations.
- Wavefront error analysis was performed using Zernike polynomial expansion up to the 6th order.
Main Results:
- Both PDI and HS techniques yielded similar wavefront aberration maps under identical conditions.
- Maximum root-mean-square wavefront error difference was 0.08 microm, reducing to 0.03 microm when excluding lower-order terms.
- The influence of pupil size and Zernike expansion order on reconstruction was assessed.
Conclusions:
- The study validates the comparable accuracy of PDI and HS for wavefront aberration mapping.
- Combining PDI and HS offers a robust method for measuring complex phase profiles, leveraging the strengths of each technique.
