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Related Concept Videos

Biasing of Metal-Semiconductor Junctions01:27

Biasing of Metal-Semiconductor Junctions

Biasing metal-semiconductor junctions involves applying a voltage across the junction. Specifically, the metal is connected to a voltage source, while the semiconductor is grounded. This technique is essential for controlling the direction and magnitude of current flow in electronic devices, including diodes, transistors, and photovoltaic cells.
In Schottky junctions, where the semiconductor is n-type, applying a positive voltage to the metal relative to the semiconductor reduces its Fermi...
Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The semiconductor's...

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Related Experiment Video

Updated: Jun 16, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
09:38

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

Published on: December 18, 2015

Variable metal mesh coupler for far infrared lasers.

R Ulrich, T J Bridges, M A Pollack

    Applied Optics
    |January 23, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel infrared interference filter replaces traditional mirrors in far infrared lasers, enabling variable output coupling. This optimization enhances laser power, improves beam quality, and aids in gain determination.

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    Published on: November 22, 2019

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    Last Updated: Jun 16, 2026

    Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
    09:38

    Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

    Published on: December 18, 2015

    Low-cost Custom Fabrication and Mode-locked Operation of an All-normal-dispersion Femtosecond Fiber Laser for Multiphoton Microscopy
    08:48

    Low-cost Custom Fabrication and Mode-locked Operation of an All-normal-dispersion Femtosecond Fiber Laser for Multiphoton Microscopy

    Published on: November 22, 2019

    Area of Science:

    • Optics and Photonics
    • Laser Physics
    • Spectroscopy

    Background:

    • Traditional pierced output mirrors in far infrared lasers present limitations in coupling efficiency and beam quality.
    • Optimizing laser output coupling is crucial for maximizing power and maintaining beam characteristics.

    Purpose of the Study:

    • To introduce and characterize a novel variable infrared interference filter for far infrared molecular lasers.
    • To demonstrate the advantages of this filter over traditional output coupling methods.
    • To utilize the filter for determining the laser's linear gain.

    Main Methods:

    • Development of a variable reflector using two parallel metal mesh grids.
    • Theoretical analysis and experimental validation of the interference filter's performance.
    • Comparison of interference filter coupling with traditional hole coupling.

    Main Results:

    • The interference filter allows adjustable reflectance by varying the spacing between metal mesh grids.
    • Uniform coupling across the reflector's cross-section was achieved, reducing diffraction losses.
    • Improved angular distribution of the output laser beam was observed.
    • The variable reflector was successfully employed to measure the laser's linear gain.

    Conclusions:

    • The infrared interference filter offers a superior alternative to pierced mirrors for far infrared lasers.
    • Variable coupling enhances laser performance, including power output and beam quality.
    • This technology provides a new tool for laser characterization, such as gain measurement.