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Related Experiment Video

Updated: Jun 16, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Paired source testing of optical systems.

R R Shannon, C Rodriguez-Torres

    Applied Optics
    |January 23, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel interferometric technique for optical system analysis. It uses intrinsic detectors and point source imaging to accurately determine focus and identify system errors without system modification.

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    Area of Science:

    • Optical Engineering
    • Metrology
    • Interferometry

    Background:

    • Accurate optical system characterization is crucial for performance.
    • Existing interferometric methods often require system modification or external detectors.
    • Non-invasive, intrinsic measurement techniques are highly desirable.

    Purpose of the Study:

    • To present a new, non-invasive interferometric technique for optical system evaluation.
    • To demonstrate the unambiguous determination of focus position.
    • To identify other optical system aberrations using fringe pattern analysis.

    Main Methods:

    • Imaging a pair of coherent point sources through the optical system.
    • Examining the resulting fringe pattern in an out-of-focus position.

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    Last Updated: Jun 16, 2026

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    Transmission of Multiple Signals through an Optical Fiber Using Wavefront Shaping
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  • Analyzing fringe period and structure to extract system parameters.

    • Main Results:

    • The technique allows for unambiguous determination of the focus position.
    • Fringe pattern analysis reveals additional optical system errors.
    • Experimental verification confirms the practicality and effectiveness of the method.

    Conclusions:

    • The developed technique offers a practical, non-invasive approach to optical system metrology.
    • It leverages intrinsic detectors and readily available imaging principles.
    • This method enhances optical system testing by providing focus and error data simultaneously.