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Related Concept Videos

UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview01:02

Ultraviolet and Visible (UV–Vis) Spectroscopy: Overview

Ultraviolet–visible (UV–visible or UV–Vis) spectroscopy is an analytical technique that investigates the interaction between matter and UV–Vis light within the electromagnetic spectrum. This method is widely used for its versatility, simplicity, and relatively quick data acquisition, making it valuable for both qualitative and quantitative analysis. When UV–Vis radiation passes through a material,  molecules absorb light depending on the energy required for electronic transitions. As a result...

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Related Experiment Video

Updated: Jun 16, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
08:53

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

Published on: October 9, 2012

Scanning ultrahigh vacuum reflectometer.

T Huen, G B Irani, F Wooten

    Applied Optics
    |January 23, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A new reflectometer enables precise vacuum ultraviolet (vuv) reflectance measurements of solids. This instrument offers improved sensitivity and resolution for vuv spectroscopy applications.

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    Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation
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    Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

    Published on: October 30, 2012

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    Last Updated: Jun 16, 2026

    Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
    08:53

    Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

    Published on: October 9, 2012

    Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation
    09:53

    Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

    Published on: October 30, 2012

    Area of Science:

    • Materials Science
    • Optical Physics
    • Spectroscopy

    Background:

    • Accurate measurement of solid reflectance is crucial for understanding material properties.
    • Vacuum ultraviolet (vuv) wavelengths present unique challenges for optical measurements due to material interactions and low photon flux.

    Purpose of the Study:

    • To develop and validate a reflectometer capable of continuous, high-precision reflectance measurements in the vacuum ultraviolet (vuv) spectral range.
    • To address the limitations of existing techniques in vuv reflectance analysis.

    Main Methods:

    • In situ sample preparation within an ultrahigh vacuum environment to ensure surface cleanliness.
    • Utilization of electronic lock-in amplification to overcome the challenge of low signal intensity.
    • Development of a reflectometer covering a wavelength range from 1100 Å to 7000 Å.

    Main Results:

    • Achieved an absolute error of reflectance of ±0.03.
    • Estimated relative precision of ±0.002 or better.
    • Demonstrated substantial improvements in sensitivity and resolution for vuv reflectance measurements.

    Conclusions:

    • The developed reflectometer successfully extends continuous near-normal-incidence reflectance measurements into the vuv wavelength range.
    • The instrument's design overcomes key challenges, offering enhanced performance for vuv optical characterization.
    • This advancement provides a valuable tool for the study of solid-state properties in the vuv spectrum.