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Overview of Microscopy Techniques

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Real-Time, Two-Color Stimulated Raman Scattering Imaging of Mouse Brain for Tissue Diagnosis

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Rapid scanning microscope for light probing and infrared mapping.

R J Phelan, N L Demeo

|January 23, 2010

Summary

This summary is machine-generated.

A novel rapid scanning microscope uses a vibrating single mirror to create a raster pattern for light-probing semiconductor devices. This system efficiently observes infrared emission and transmission with a wide field of view.

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Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging

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Published on: November 25, 2009

Area of Science:

Optoelectronics
Materials Science
Microscopy

Background:

Semiconductor device analysis requires advanced imaging techniques.
Observing infrared emission and transmission is crucial for device characterization.

Purpose of the Study:

To design and implement a rapid scanning microscope for semiconductor device analysis.
To enable efficient light-probing and infrared observation of devices.

Main Methods:

Development of a rapid scanning microscope centered around a single, dual-axis vibrating mirror.
Utilizing standard microscope components for system integration.
Deflecting a light beam into a raster pattern for wide-angle scanning.

Main Results:

Successful demonstration of the microscope for light-probing semiconductor devices.
Effective observation of infrared emission and transmission from devices.
Achieved useful wide-angle deflections and a large field of view.

Conclusions:

The single mirror scanner is a simple yet effective component for rapid microscopy.
The developed system offers a practical approach to semiconductor device characterization.
The microscope design allows for versatile applications in optoelectronics and materials science.