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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Moiré fringe multiplication with a nonsymmetrical doubly blazed reference grating
Applied Optics
|January 23, 2010
Summary
This study introduces an optimized Moiré fringe technique for precise in-plane displacement measurement. The method enhances sensitivity using a fine reference grating, independent of specimen grating properties, for accurate contour mapping.
Area of Science:
- Optics
- Materials Science
- Metrology
Background:
- Moiré fringe techniques are used for displacement measurement.
- Existing methods have limitations in sensitivity and accuracy.
Purpose of the Study:
- To develop an optimized Moiré fringe configuration for enhanced in-plane displacement sensitivity.
- To demonstrate a method for unique contour mapping of displacements.
Main Methods:
- Utilizing a series of fine reference and coarse specimen gratings in an optimal configuration.
- Illuminating gratings to create symmetrical diffraction paths.
- Observing Moiré fringes near the axis of symmetry.
Main Results:
- Moiré sensitivity is determined by the reference grating, not the specimen grating.
- The technique uniquely depicts in-plane displacements, unaffected by grating gap variations.
- Fringe multiplication factors up to 60 were achieved using gratings up to 12,000 rulings/cm.
Conclusions:
- The optimized Moiré configuration offers high sensitivity and unique in-plane displacement mapping.
- This method provides superb contrast Moiré fringes, comparable to two-beam interference.
- Adaptable use of existing gratings for double-order dominance is demonstrated.
