Interference and Diffraction
IR Spectrometers
Shear on the Horizontal Face of a Beam Element
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
This study explains a shearing interferometer using moiré patterns and Fourier imaging. It details how to achieve high-contrast patterns for measuring wavefront distortion derivatives, useful for lens aberration analysis.
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