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Electrostatically scanned reflectors for interferometer and laser applications.
Applied Optics
|January 30, 2010
Summary
This study introduces an electrostatically scanned film reflector offering high sensitivity and low power consumption. This advanced optical device is ideal for interferometer and laser systems, especially in the infrared spectrum.
Area of Science:
- Optics and Photonics
- Electro-mechanical Systems
Background:
- Traditional optical reflectors can be limited by power requirements and displacement capabilities.
- Developing precise and efficient scanning mechanisms is crucial for advanced optical systems.
Purpose of the Study:
- To design and evaluate an electrostatically scanned film reflector.
- To demonstrate high drive scan sensitivity and low power consumption.
- To assess the optical properties and displacement capabilities for practical applications.
Main Methods:
- Design of an electrostatic scanning mechanism for a film reflector.
- Characterization of drive scan sensitivity at 6328 Angstroms.
- Measurement of power requirements for polarization and drive functions.
- Evaluation of optical quality and linear displacement range.
Main Results:
- Achieved a drive scan sensitivity exceeding one wavelength per volt at 6328 Angstroms.
- Demonstrated extremely low power requirements for both polarization and drive.
- Confirmed good optical properties and large linear displacements.
- The device exhibits potential for widespread use in optical systems.
Conclusions:
- The electrostatically scanned film reflector offers a high-performance, low-power solution.
- Its capabilities make it suitable for demanding applications in interferometry and laser systems.
- The device shows particular promise for infrared spectroscopy and instrumentation.
