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Updated: Jun 16, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Quick extended x-ray absorption fine structure instrument with millisecond time scale, optimized for in situ
S Khalid1, W Caliebe, P Siddons
1National Synchrotron Light Source (NSLS), Brookhaven National Laboratory, Upton, New York 11973, USA.
Researchers enhanced quick X-ray absorption spectroscopy (QEXAFS and XANES) for sub-second material analysis. This advancement enables rapid in situ structural studies for diverse scientific applications.
Area of Science:
- Materials Science
- Spectroscopy
- Synchrotron Radiation
Background:
- Understanding in situ structural dynamics in materials is crucial for various scientific fields.
- Existing X-ray absorption spectroscopy techniques have limitations in time resolution for capturing rapid changes.
Purpose of the Study:
- To refine quick extended X-ray absorption fine structure (QEXAFS) and quick X-ray absorption near edge structure (XANES) techniques.
- To enable sub-second time scale in situ structural analysis of materials.
Main Methods:
- Utilized a refined QEXAFS/XANES system at beamline X18B, National Synchrotron Light Source.
- Implemented a 5 Hz oscillating monochromator driven by a cam, motor, pulley, and belt system with noise damping.
- Collected full EXAFS/XANES spectra (4.7-40.0 KeV) in 100 ms, comparable to standard data.
Main Results:
- Achieved sub-second time resolution for EXAFS scans.
- Demonstrated the ability to collect data rapidly in ascending and descending energy orders without beam time loss.
- The QEXAFS system is easily switched from conventional mode.
Conclusions:
- The refined QEXAFS/XANES technique significantly enhances the ability to study dynamic material processes.
- This method is applicable to time-resolved data acquisition in electrochemical, photochemical, catalytic, materials, and environmental sciences.
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