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Stretching Short Sequences of DNA with Constant Force Axial Optical Tweezers

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Published on: October 13, 2011

Microdisplacement sensor using an optically trapped microprobe based on the interference scale.

Masaki Michihata¹, Terutake Hayashi, Daisuke Nakai

¹Department of Mechanical Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.

The Review of Scientific Instruments

|February 2, 2010

Summary

This study introduces a novel nanoscale displacement sensor utilizing laser-trapped microspheres and interference scales. It offers high resolution and accuracy for precise microsystem positioning in confined spaces.

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Area of Science:

Microsystems Engineering
Nanotechnology
Optical Metrology

Background:

Accurate positioning is critical for microsystem development.
Nanoscale displacement sensing is essential for high-precision positioning devices.

Purpose of the Study:

To propose and investigate a new displacement sensor for microsystems.
To achieve nanoscale accuracy, wide measuring range, and accessibility for narrow targets.

Main Methods:

Employs an interference scale as a linear scale and a laser-trapped microsphere as a sensing probe.
Optical trapping of a glass microsphere using laser trapping technique.
Measurement of distance based on the shift of the interference scale generated between the target surface and the probe.

Main Results:

Achieved a resolution of 10 nm and an accuracy of +/-50 nm.
Demonstrated a measurable range of 250 micrometers.
Sensor is suitable for target areas smaller than 15 micrometers and inclined surfaces (<15 degrees), identifying displacement direction.

Conclusions:

The proposed displacement sensor offers high resolution and accuracy for microsystem positioning.
Its design allows for measurements in narrow and inclined target areas.
Potential for further improvement by utilizing shorter wavelength trapping lasers.