Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

Cameron M Kewish1, Pierre Thibault, Martin Dierolf

  • 1Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland. Cameron.Kewish@psi.ch

Ultramicroscopy
|February 2, 2010
PubMed