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Updated: Oct 8, 2025

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks

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Published on: April 28, 2023

Split beam spectrophotometer.

H A Washburn, J H Marshall, H H Soonpaa

|February 2, 2010

Summary

A novel spectrophotometer measures thin film transmissivity and reflectivity. This instrument is ideal for small samples (1 mm²) where reference samples are difficult to prepare.

Area of Science:

Spectroscopy
Optical Physics
Materials Science

Background:

Traditional spectrophotometry faces challenges with small or uniquely prepared samples.
Preparing identical reference layers for thin films on substrates can be problematic.
Existing instruments may have limitations with specific sample types or sizes.

Purpose of the Study:

To develop a single light source-single detector spectrophotometer.
To enable continuous measurement of transmissivity or reflectivity versus wavelength.
To facilitate analysis of small-area thin film samples (1 mm² and smaller).

Main Methods:

Construction of a custom spectrophotometer using commercially available components.
Incorporation of a custom-made chopper blade.

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Utilization of reflecting optics for broad wavelength applicability.

Main Results:

The instrument successfully records transmissivity or reflectivity as a function of wavelength.
Measurements were performed on thin film samples as small as 1 mm².
The use of reflecting optics eliminated wavelength limitations.

Conclusions:

The developed spectrophotometer is effective for analyzing small-area thin film samples.
The instrument overcomes challenges associated with reference sample preparation.
Its design allows for versatile application across various wavelengths.