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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Related Experiment Video

Updated: Jun 16, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Scanning electron microdensitometry.

I L Kofsky, J D Geller, C S Miller

    Applied Optics
    |February 2, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Scanning electron beams accurately measure silver distribution in photographic materials, overcoming optical imaging errors. This method precisely quantifies silver concentration, enabling high-resolution detail retrieval.

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    Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

    Published on: July 5, 2016

    Area of Science:

    • Materials Science
    • Imaging Science
    • Analytical Chemistry

    Background:

    • Optical microdensitometry and projection systems suffer from diffraction and partial coherence, limiting accurate measurement of fine photographic details.
    • Nonlinearities inherent in optical imaging introduce significant errors when analyzing small-scale photographic features.

    Purpose of the Study:

    • To investigate an alternative method for accurately measuring silver distribution in photographic materials.
    • To overcome the limitations of optical imaging techniques for high-resolution analysis of photographic emulsions.

    Main Methods:

    • Utilizing a narrow beam of energetic electrons to scan the silver distribution within photographic emulsions.
    • Counting secondary quanta (low-energy electrons) and high-energy (backscattered) electrons emitted during electron beam scanning.
    • Analyzing characteristic silver x-ray fluorescence as a measure of local silver concentration.

    Main Results:

    • The number of emitted secondary and backscattered electrons directly correlates with local silver concentration.
    • Characteristic Ag x-ray fluorescence also serves as a reliable indicator of silver content.
    • A mechanism for secondary electron contrast, partially attributed to surface relief, was elucidated.
    • Spatial frequencies as high as 2280 line pairs per millimeter were successfully retrieved using this electron beam probe method.

    Conclusions:

    • Scanning electron beam probes offer a precise and accurate method for quantifying silver distribution in photographic materials.
    • This technique effectively bypasses the nonlinearities and errors associated with traditional optical imaging methods.
    • The electron beam scanning approach enables high-resolution analysis and retrieval of fine details in photographic emulsions.