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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Alignment, orientation, and range finding by diffraction gratings.

P S Theocaris, C Liakopoulos

|February 4, 2010

Summary

This study introduces a simple diffraction grating method for precise target alignment and parallelism. The technique uses laser light and grating patterns to achieve accurate measurements, enhancing optical setups.

Area of Science:

Optics and Photonics
Metrology
Diffraction Physics

Background:

Accurate alignment and parallelism are critical in optical systems.
Traditional alignment methods can be complex and time-consuming.

Purpose of the Study:

To develop a simple, accurate method for target alignment and parallelism using diffraction gratings.
To enable precise distance and angle measurements between optical components.

Main Methods:

Utilizing coherent, monochromatic laser light to illuminate a target (cross slit or annular aperture).
Employing a reference diffraction grating placed at a distance from the target.
Analyzing the distorted target images formed by principal maxima on the grating plane.

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Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

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Last Updated: Jun 16, 2026

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Main Results:

Achieved alignment by displacing the grating to create a symmetric pattern of the principal maximum image.
Enabled accurate estimation of distance and angle between target and grating via image size and distortion.
Demonstrated simplicity and flexibility with amplitude gratings of varying line frequencies.

Conclusions:

The diffraction grating method offers a straightforward and effective solution for optical alignment and metrology.
The technique's accuracy is significantly improved by automated spectrum analysis.
This method provides a versatile tool for various scientific and industrial applications requiring precise optical setups.