Related Experiment Video
Updated: Jun 16, 2026

09:32
Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Measurement of thin film parameters with a prism coupler
Applied Optics
|February 4, 2010
Abstract:
The prism coupler, known from experiments on integrated optics, can be used to determine the refractive index and the thickness of a light-guiding thin film. Both parameters are obtained simultaneously and with good accuracy by measuring the coupling angles at the prism and fitting them by a theoretical dispersion curve. The fundamentals and limitations. of this method are discussed, its practical use, and mathematical procedures for the evaluation.

