Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Tracking sub-nanometer thermal structural changes with speckle interferometry.

Applied optics·2020
Same author

Sub-picometer dynamic measurements of a diffuse surface.

Applied optics·2019
Same author

Effect of retroreflection on a Fizeau phase-shifting interferometer.

Applied optics·2010
Same author

Absolute testing of flats by using even and odd functions.

Applied optics·2010
Same author

Testing an optical window of a small wedge angle: effect of multiple reflections.

Applied optics·2010
Same author

Testing spherical surfaces: a fast, quasi-absolute technique.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jun 16, 2026

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
12:14

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

White light extended source shearing interferometer.

J C Wyant

    Applied Optics
    |February 4, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel grating lateral shear interferometer works with white light sources. This advanced optical instrument also demonstrates utility with specific extended sources, expanding its applications.

    More Related Videos

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
    07:55

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

    Published on: September 22, 2017

    A Multimodal Wide-Field Fourier-Transform Raman Microscope
    06:48

    A Multimodal Wide-Field Fourier-Transform Raman Microscope

    Published on: December 30, 2025

    Related Experiment Videos

    Last Updated: Jun 16, 2026

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry
    12:14

    The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

    Published on: August 12, 2013

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
    07:55

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

    Published on: September 22, 2017

    A Multimodal Wide-Field Fourier-Transform Raman Microscope
    06:48

    A Multimodal Wide-Field Fourier-Transform Raman Microscope

    Published on: December 30, 2025

    Area of Science:

    • Optical physics
    • Interferometry

    Background:

    • Lateral shear interferometers are crucial for optical testing.
    • Traditional interferometers often require monochromatic light sources.

    Purpose of the Study:

    • To describe a grating lateral shear interferometer compatible with white light.
    • To demonstrate its application with extended sources.

    Main Methods:

    • Development of a grating-based lateral shear interferometer.
    • Experimental validation using a white light source.
    • Testing with specific types of extended sources.

    Main Results:

    • Successful operation of the interferometer with broadband white light.
    • Demonstration of interference patterns from extended sources.
    • Characterization of the interferometer's performance.

    Conclusions:

    • The grating lateral shear interferometer is a versatile tool for optical metrology.
    • Its compatibility with white light and extended sources broadens its practical applications.