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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Holographic interferometry technique utilizing two plates and relative fringe orders for measuring

P W King Iii

    Applied Optics
    |February 4, 2010
    PubMed
    Summary

    No abstract available in PubMed .

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