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Related Concept Videos

Eccentricity of an Ellipse01:27

Eccentricity of an Ellipse

An ellipse is a fundamental conic section defined by the constant sum of distances from any point on its curve to two fixed points, known as the foci. This geometric property can be physically demonstrated using a pencil, string, and two pins. By anchoring the string at both ends and maintaining it taut with a pencil, one can trace the outline of an ellipse.The shape and extent of the ellipse are determined by its eccentricity, e, defined as the ratio of the distance between the center and a...
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An ellipse is formed when a right circular cone is intersected by an inclined plane that does not cut through its base. This intersection yields a closed, symmetric curve characterized by distinctive geometric properties. Most notably, an ellipse is defined as the collection of all points in a plane for which the combined distances to two fixed points—called the foci—remain constant.The ellipse features two principal axes: the major and the minor axes. The major axis is the longest diameter,...

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High precision alignment procedure for an ellipsometer.

J R Zeidler, R B Kohles, N M Bashara

    Applied Optics
    |February 4, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Beam deviation in polarizing elements causes ellipsometer alignment errors. A new, faster procedure eliminates these errors, achieving high precision alignment for specimens and lasers comparable to the ellipsometer

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    Area of Science:

    • Optical metrology
    • Instrument alignment

    Background:

    • Ellipsometry is a powerful optical technique for material characterization.
    • Existing alignment procedures for ellipsometers are susceptible to errors caused by beam deviation in polarizing elements.

    Purpose of the Study:

    • To describe a high-precision alignment procedure for ellipsometers.
    • To eliminate errors caused by beam deviation in polarizing elements.
    • To provide a method for precise alignment of specimens and lasers.

    Main Methods:

    • A novel alignment procedure was developed to counteract beam deviation.
    • The method focuses on precise optical path alignment within the ellipsometer.

    Main Results:

    • The new procedure effectively eliminates errors from beam deviation.
    • Alignment accuracy is comparable to the ellipsometer's resolution limit (0.01-0.005 degrees).
    • The procedure is faster than existing methods.

    Conclusions:

    • The described high-precision alignment procedure offers improved accuracy and speed.
    • This method enhances the reliability of ellipsometric measurements.
    • It provides a robust solution for aligning specimens and lasers with the ellipsometer.