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Updated: Jun 16, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Combined apertureless near-field optical second-harmonic generation/atomic force microscopy imaging and nanoscale
Kent A Meyer1, Kin C Ng, Zhanjun Gu
1Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Abstract:
A dual function atomic force/near-field scanning optical microscope (AFM/NSOM) with an ultrafast laser excitation source was used to investigate apertureless, tip enhanced second-harmonic generation (SHG) of ZnO nanowires with spatial resolution below the optical diffraction limit. Single-wire SHG spectra show little to no contribution from bandgap or other emission. Polarization data established values for chi(33)/chi(31) close to previous estimates and confirm the SHG process. Experimental results indicate that the SHG signal was reduced for nanowires after exposure to an atmosphere of carbon dioxide and water vapor. An equation was derived for estimating the minimum chi(2) detectable using apertureless SHG NSOM.
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