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Updated: Jun 16, 2026

Plasma-Assisted Molecular Beam Epitaxy Growth of Mg3N2 and Zn3N2 Thin Films
Published on: May 11, 2019
Refractive Index Determination of Layered Compound ZnIn(2)S(4)
Abstract:
Refractive index measurements of layer structure crystals of ZnIn(2)S(4) were performed over the 0.45-1.25 microm wavelength range. An improved interferometric method that allowed a precision of 0.2% in the n(lambda) values was used.
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