Related Experiment Video
Updated: Jun 16, 2026

11:34
Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
Published on: May 15, 2017
Abstract:
An image detection technique using remote ir laser readout of optically injected carriers is described. The image target consists of homogeneous, contact-free semiconductor surfaces. The equations governing sensitivity, response time, and resolution are presented. Experimental results and practical configurations are described.

