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Area of Science:

Optics and Photonics
Materials Science
Infrared Technology

Background:

Homogeneity analysis of infrared (IR) materials is crucial for optical system performance.
Waveform inspection of optical systems requires precise interferometric methods.
Existing interferometers face limitations in handling materials with extreme absorption or reflectivity.

Purpose of the Study:

To introduce a new interferometer design for IR material homogeneity analysis and optical system waveform inspection.
To enhance fringe contrast control by leveraging diffraction grating polarization-dependent efficiency.
To enable the evaluation of a wider range of material transmittances (10-100%).

Main Methods:

Development of a new interferometer utilizing a diffraction grating as a beam divider.
Exploitation of the grating's efficiency variation with the plane of polarization orientation.
Application of the interferometer at a wavelength of 10.6 µm.

Main Results:

The new interferometer successfully analyzes IR material homogeneity and inspects optical system waveforms.
Adjustable fringe contrast allows compensation for photometric losses in absorbing or highly reflecting materials.
The system demonstrated capability in evaluating materials across a broad 10-100% transmission range.

Conclusions:

The developed diffraction grating interferometer offers enhanced capabilities for IR material characterization.
This innovation improves the compensation of optical losses, expanding the range of testable materials.
The interferometer provides a versatile tool for optical metrology at 10.6 µm.