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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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Two wavelength measurements of optical waveguide parameters.

G B Brandt

    Applied Optics
    |February 6, 2010
    PubMed
    Summary

    This study presents a two-wavelength optical waveguide measurement technique. It accurately determines refractive index and thickness for single-mode and multimode guides, offering an alternative to existing methods.

    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Accurate characterization of optical waveguide parameters like refractive index and thickness is crucial for device performance.
    • Existing methods may have limitations in applicability to different waveguide types or require specific conditions.

    Purpose of the Study:

    • To introduce and detail a novel two-wavelength measurement technique for optical waveguides.
    • To demonstrate the accuracy and versatility of this method for both single-mode and multimode guides.

    Main Methods:

    • Utilizing mode propagation constants measured at two distinct wavelengths.
    • Employing knowledge of optical component refractive indices at these wavelengths, with interpolation for unavailable data.
    • Describing both the experimental setup and analytical framework of the technique.

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    Last Updated: Jun 16, 2026

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    Published on: November 30, 2012

    Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
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    Main Results:

    • The two-wavelength method provides accurate measurements of waveguide refractive index and thickness.
    • The technique is applicable to both single-mode and multimode optical guides.
    • It offers comparable accuracy to the established two-mode method.

    Conclusions:

    • The described two-wavelength technique is a viable and accurate method for optical waveguide characterization.
    • Its applicability to various waveguide types enhances its utility in optical component analysis.
    • The method provides a robust approach for determining essential waveguide parameters.