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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Related Experiment Video

Updated: Jun 16, 2026

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
09:49

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope

Published on: March 16, 2022

An improved image alignment procedure for high-resolution transmission electron microscopy.

Fang Lin1, Yan Liu, Xiaoyan Zhong

  • 1College of Science, South China Agricultural University, GuangZhou, GuangDong 510642, China. linfang@scau.edu.cn

Micron (Oxford, England : 1993)
|February 13, 2010
PubMed
Summary
This summary is machine-generated.

Accurate image alignment in transmission electron microscopy is improved by filtering high-frequency image components. This method enhances image processing techniques like reconstruction and averaging, especially for crystalline specimens.

More Related Videos

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Related Experiment Videos

Last Updated: Jun 16, 2026

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
09:49

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope

Published on: March 16, 2022

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Area of Science:

  • Materials Science
  • Physics
  • Image Processing

Background:

  • Image alignment is crucial for high-resolution transmission electron microscopy (HRTEM) techniques.
  • Specimen drift and image shifts cause displacements in experimental image series, necessitating alignment before further processing.

Purpose of the Study:

  • To investigate a method for achieving more accurate image alignment in HRTEM.
  • To compare the accuracy of different image alignment methods using correlation functions.

Main Methods:

  • Filtering high-frequency components of images using an appropriate aperture.
  • Determining image displacement via the correlation function of shifted images.
  • Comparing alignment accuracies against error functions in through-focus exit-wavefunction reconstruction (maximum-likelihood method).

Main Results:

  • Filtering high-frequency components, especially for crystalline specimens, significantly improves image alignment accuracy.
  • Optimal filter aperture size (covering innermost lattice reflections) is critical for crystalline samples.
  • Improved alignment leads to clearer crystal lattice fringes in averaged images of graphene and carbon nanotubes.

Conclusions:

  • A novel image alignment technique using high-frequency filtering enhances HRTEM image processing.
  • This method is particularly effective for crystalline specimens, improving reconstruction and averaging.
  • The study demonstrates the practical benefits of optimized image alignment for analyzing nanoscale materials.