Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry

Seung Hwan Kim1, Seoung Hun Lee, Jae In Lim

  • 1Inha University, 253 Yonghyun-dong, Nam-gu, Incheon 402-751, Korea.

Applied Optics
|February 16, 2010
PubMed
Summary

This study presents a simple white-light interferometric method for accurately measuring the absolute phase refractive index of optical materials. The technique is validated for fused silica and BK7, offering a wide spectral range in a single run.

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