Related Experiment Video
Updated: Jun 16, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry
Seung Hwan Kim1, Seoung Hun Lee, Jae In Lim
1Inha University, 253 Yonghyun-dong, Nam-gu, Incheon 402-751, Korea.
This study presents a simple white-light interferometric method for accurately measuring the absolute phase refractive index of optical materials. The technique is validated for fused silica and BK7, offering a wide spectral range in a single run.
Area of Science:
- Optics and Photonics
- Materials Science
Background:
- Accurate measurement of optical material properties is crucial for various applications.
- Existing methods for refractive index measurement can be complex or limited in spectral range.
Purpose of the Study:
- To develop a simple and accurate method for measuring the absolute phase refractive index of optical materials.
- To cover a wide spectral range in a single measurement run.
Main Methods:
- Utilized a white-light interferometric technique.
- Employed angle rotation of an optical plate sample within the interferometer.
- Measured absolute phase refractive index of fused silica and BK7 flat plates.
Main Results:
- Successfully measured absolute phase refractive indices for fused silica and BK7.
- Validated the method against established Sellmeier dispersion formulas.
- Achieved an accuracy of 0.002 in refractive index measurement.
Conclusions:
- The developed white-light interferometric method is effective for measuring absolute phase refractive index.
- The accuracy can be further improved by enhancing the angle measurement precision.
- This technique offers a simple and efficient approach for optical material characterization.
Related Concept Videos
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview
The ATR process begins by directing a beam...
IR Spectrometers
Infrared (IR) Spectroscopy: Overview
Different compounds display unique properties due to their...
Total Internal Reflection Fluorescence Microscopy
Electronic Distance Measuring Instruments

