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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Related Experiment Video

Updated: Jun 16, 2026

Direct Imaging of Laser-driven Ultrafast Molecular Rotation
10:52

Direct Imaging of Laser-driven Ultrafast Molecular Rotation

Published on: February 4, 2017

Iodine stabilized laser with three internal mirrors.

J B Cole, C F Bruce

    Applied Optics
    |February 16, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study details an improved Helium-Neon (He-Ne) laser stabilized using iodine vapor. The new design achieves high frequency stability and precise wavelength measurements, crucial for metrology.

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    Last Updated: Jun 16, 2026

    Direct Imaging of Laser-driven Ultrafast Molecular Rotation
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    Femtosecond Laser Filaments for Use in Sub-Diffraction-Limited Imaging and Remote Sensing

    Published on: April 25, 2019

    Area of Science:

    • Atomic, Molecular, and Optical Physics
    • Metrology and Measurement Science

    Background:

    • Helium-Neon (He-Ne) lasers are fundamental tools in metrology.
    • Stabilization using saturated absorption enhances laser precision.
    • Iodine-129 ((129)I(2)) vapor provides a reliable reference for laser frequency stabilization.

    Purpose of the Study:

    • To describe the construction and operation of a novel He-Ne laser.
    • To enhance laser frequency stability through advanced stabilization techniques.
    • To accurately measure the laser's wavelength against the Krypton-86 standard.

    Main Methods:

    • Utilized a fused silica He-Ne laser with internal mirrors.
    • Implemented a three-mirror cavity design to optimize absorber interaction.
    • Employed a control system with simultaneous first- and third-harmonic error sensing for stabilization.
    • Measured laser frequency and wavelength against the Krypton-86 ((86)Kr) standard.

    Main Results:

    • The constructed He-Ne laser demonstrated high frequency stability.
    • The measured wavelength of a specific hyperfine component was determined to be 632991 327 ± 0.7 fm.
    • Results are consistent with the Rowley-Hamon model of the krypton line profile.

    Conclusions:

    • The developed He-Ne laser system offers superior performance for frequency stabilization.
    • The precise wavelength measurement contributes to the accuracy of length standards.
    • The advanced stabilization technique validates its effectiveness in metrological applications.