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A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
Published on: September 30, 2019
Michelson interferometer for detection of fast displacements of less than a quarter-wave over small areas
Applied Optics
|February 16, 2010
Abstract:
A modified Michelson interferometer is described that allows calibration and measurement simultaneously. The method is used to detect displacements down to 1 nm with a time resolution of 40 nsec. These values are close to theoretical resolution limits for the experimental arrangement. The probing beam is focused onto the investigated sample, allowing measurements with a lateral resolution of 1.5 microm. The method has been applied to investigate the deformation behavior of pulsed diode lasers.
