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Updated: Jun 16, 2026

Non-equilibrium Microwave Plasma for Efficient High Temperature Chemistry
Published on: August 1, 2017
Diffraction limitations for plasma electron density measurements with schlieren methods
Abstract:
Restrictions imposed by diffraction on schlieren electron density measurements are discussed. Applicability criteria are derived. It is shown that diffraction partly compensates for the advantage of longer wavelengths: while the deflection angles increase with lambda(2), the gain in measuring precision increases only with radicallambda. The criteria are not restricted to a particular spectral range. However, they were derived with special regard to extending schlieren methods to the far infrared (FIR).
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