Optical parameters of partially transmitting thin films. 1: Basic theory of a novel method for their determinations

Area of Science:

• Optics and Photonics
• Materials Science

Background:

• Accurate characterization of thin film properties is crucial for optical and electronic devices.
• Existing methods often require complex setups or absolute measurements of light intensity and polarization.

Purpose of the Study:

• To present a novel optical method for determining thin film parameters.
• To establish the theoretical basis for this new characterization technique.

Main Methods:

• Directing two coherent light beams onto a partially transmitting thin film.
• Analyzing the intensities of the two emitted beams.
• Developing a theoretical framework based on light-matter interaction.

Main Results:

• The method enables determination of film thickness, refractive index, and absorption coefficient.
• The technique avoids the need for absolute light intensity or polarization measurements.
• Theoretical foundation for the method is established.

Conclusions:

• The proposed optical method offers a simplified approach to thin film characterization.
• This technique has potential for various applications in materials science and optics.
• Further experimental validation is presented in Part 2.