Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Chirurgie (Heidelberg, Germany)·2025
Same author

[Burden of bureaucracy in surgery : Results of a national survey].

Chirurgie (Heidelberg, Germany)·2025
Same author

[A cold nodule, a dramatic course and a curious finding].

Chirurgie (Heidelberg, Germany)·2025
Same author

[Young female patient with bony frontotemporal swelling].

HNO·2020
Same author

[Suspected abscess formation in the inferior rectus muscle].

HNO·2020
Same author

[Recurrent frontal swelling in a child].

HNO·2018

Related Experiment Video

Updated: Jun 16, 2026

Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera
06:28

Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera

Published on: January 30, 2020

Secondary electron conduction camera tube for space applications.

C Kunze, H Samuelsson

    Applied Optics
    |February 19, 2010
    PubMed
    Summary

    A new secondary electron conduction (SEC) camera tube was developed for space, enabling advanced astronomical and Earth observation instruments. This novel detector offers improved performance for space-based imaging applications.

    Area of Science:

    • Space technology
    • Detector physics
    • Applied optics

    Background:

    • Development initiated for space applications.
    • Review of anticipated uses in astronomy and Earth observation.
    • Modifications to standard Heimann GmbH SEC camera tube.

    Purpose of the Study:

    • Develop a novel camera tube for space applications utilizing the SEC effect.
    • Describe construction modifications to a standard SEC tube.
    • Assess the performance of the developed tube.

    Main Methods:

    • Utilized secondary electron conduction (SEC) effect for camera tube design.
    • Modified a standard Heimann GmbH SEC camera tube.
    • Performance assessment in a standard European scan format test facility.

    More Related Videos

    Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
    07:50

    Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

    Published on: July 17, 2015

    Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
    11:14

    Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

    Published on: May 28, 2016

    Related Experiment Videos

    Last Updated: Jun 16, 2026

    Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera
    06:28

    Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera

    Published on: January 30, 2020

    Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
    07:50

    Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

    Published on: July 17, 2015

    Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
    11:14

    Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

    Published on: May 28, 2016

    Main Results:

    • Successfully developed a camera tube based on the SEC effect for space.
    • Detailed modifications to the standard tube construction.
    • Initial performance assessment completed in a standard test facility.

    Conclusions:

    • The developed SEC camera tube is suitable for various space applications.
    • The modified tube design meets the requirements for astronomical and Earth observation instruments.
    • Performance data indicates potential for advanced space-based imaging.