Automatic analysis of interferograms: optical waveguide refractive index profiles

Compensation of mode velocities in optical waveguides can be achieved by fabricating fibers having graded refractive index cores. One technique for measuring these index profiles is interference microscopy. We have developed a machine aided method for analysis of interference micrographs for the rapid determination of optical waveguide refractive index profiles. Our method consists of digitizing the interference micrograph with a scanning microdensitometer, followed by computer determination of the position of the center line of each fringe. The data obtained are then converted into refractive index and fiber radius information, which is used to calculate a best fit power law function.