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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Sample space for particle size and velocity measuring interferometers
Applied Optics
|February 19, 2010
Abstract:
An analysis is presented of some parameters that can affect the sampling characteristics of interferometers designed to measure particle size and/or velocity. In particular, it is demonstrated how particle size and electronic instrumentation affect the sampling capacity of the instrument.
