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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
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Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
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Atomic Emission Spectroscopy: Interference

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IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Updated: Jun 16, 2026

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
07:55

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Published on: September 22, 2017

Corner cube interferometer using extended sources.

F M Smolka, T M Brown, H A Hill

    Applied Optics
    |February 19, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A modified corner cube interferometer eliminates alignment issues using a double pass system. This design also enables precise 3D motion monitoring of previously inaccessible points.

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    Area of Science:

    • Optical physics
    • Interferometry
    • Metrology

    Background:

    • Corner cube interferometers with extended sources are sensitive to retroreflector alignment.
    • Misalignment causes optical path difference variations across the field of view.

    Purpose of the Study:

    • To eliminate alignment sensitivity in corner cube interferometers.
    • To develop a method for 3D motion monitoring using alignment errors.

    Main Methods:

    • Introducing a plane mirror to create a double pass system.
    • Analyzing the sensitivity of a single pass system to alignment errors.

    Main Results:

    • The double pass system effectively eliminates the need for precise transverse alignment.
    • The sensitivity to alignment errors in a single pass system can be leveraged for 3D motion tracking.

    Conclusions:

    • The proposed double pass system enhances the robustness of corner cube interferometers.
    • Exploiting alignment sensitivity offers a novel approach for precise 3D motion measurement.