Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Azimuths and Bearings01:19

Azimuths and Bearings

Azimuths and bearings are essential concepts in surveying, providing methods to express the direction of a line relative to a meridian. Azimuths refer to the clockwise angle measured from the north end of a reference meridian to the given line, ranging from zero to 360 degrees. This method gives a comprehensive directional reference within a full 360-degree circle, making it a straightforward way to communicate direction in various fields, including navigation, cartography, and...
Glassware Calibration01:11

Glassware Calibration

Accurate calibration of glassware, such as volumetric flasks, pipettes, and burettes, is essential to ensure accurate measurements in the analytical laboratory. Calibration helps maintain consistency across measurements and prevents errors arising from inaccurate volumes.
Volumetric flasks: Volumetric flasks are designed to prepare aqueous solutions of precise volumes accurately with a calibration line on the neck. To calibrate a volumetric flask, it is important to fill it with distilled...
Instrument Calibration01:12

Instrument Calibration

Instrument calibration is essential for ensuring that instruments produce accurate and consistent results. It is vital in manufacturing, healthcare, testing laboratories, and scientific research. Calibration processes are specific to each instrument and help enhance data accuracy. Each instrument has a unique calibration process tailored to its design and function to improve data accuracy.
Analytical Balance Calibration
An analytical balance measures mass and requires regular calibration to...
Ellipses01:30

Ellipses

An ellipse is formed when a right circular cone is intersected by an inclined plane that does not cut through its base. This intersection yields a closed, symmetric curve characterized by distinctive geometric properties. Most notably, an ellipse is defined as the collection of all points in a plane for which the combined distances to two fixed points—called the foci—remain constant.The ellipse features two principal axes: the major and the minor axes. The major axis is the longest diameter,...
Calibration Curves: Linear Least Squares01:20

Calibration Curves: Linear Least Squares

A calibration curve is a plot of the instrument's response against a series of known concentrations of a substance. This curve is used to set the instrument response levels, using the substance and its concentrations as standards. Alternatively, or additionally, an equation is fitted to the calibration curve plot and subsequently used to calculate the unknown concentrations of other samples reliably.
For data that follow a straight line, the standard method for fitting is the linear...
Eccentricity of an Ellipse01:27

Eccentricity of an Ellipse

An ellipse is a fundamental conic section defined by the constant sum of distances from any point on its curve to two fixed points, known as the foci. This geometric property can be physically demonstrated using a pencil, string, and two pins. By anchoring the string at both ends and maintaining it taut with a pencil, one can trace the outline of an ellipse.The shape and extent of the ellipse are determined by its eccentricity, e, defined as the ratio of the distance between the center and a...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Erratum: Measurement of the Sixth-Order Cumulant of Net-Proton Multiplicity Distributions in Au+Au Collisions at sqrt[s_{NN}]=27, 54.4, and 200 GeV at RHIC [Phys. Rev. Lett. 127, 262301 (2021)].

Physical review letters·2025
Same author

Erratum: Nonmonotonic Energy Dependence of Net-Proton Number Fluctuations [Phys. Rev. Lett. 126, 092301 (2021)].

Physical review letters·2025
Same author

Observation of Strong Nuclear Suppression in Exclusive J/ψ Photoproduction in Au+Au Ultraperipheral Collisions at RHIC.

Physical review letters·2024
Same author

Hyperon Polarization along the Beam Direction Relative to the Second and Third Harmonic Event Planes in Isobar Collisions at sqrt[s_{NN}]=200  GeV.

Physical review letters·2023
Same author

Erratum: Global Polarization of Ξ and Ω Hyperons in Au+Au Collisions at sqrt[s_{NN}]=200  GeV [Phys. Rev. Lett. 126, 162301 (2021)].

Physical review letters·2023
Same author

Measurements of the Elliptic and Triangular Azimuthal Anisotropies in Central ^{3}He+Au, d+Au and p+Au Collisions at sqrt[s_{NN}]=200  GeV.

Physical review letters·2023
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jun 16, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

In process ellipsometer azimuth angle calibration.

J R Adams, N M Bashara

    Applied Optics
    |February 20, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Accurate ellipsometer calibration is achieved using two novel methods for divided circle azimuth corrections. These techniques improve precision by accounting for wavelength-dependent calibration constants and optimizing system configurations for enhanced accuracy.

    More Related Videos

    Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
    09:00

    Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

    Published on: June 28, 2018

    Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
    06:46

    Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

    Published on: August 25, 2016

    Related Experiment Videos

    Last Updated: Jun 16, 2026

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
    09:32

    Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

    Published on: January 26, 2016

    Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
    09:00

    Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

    Published on: June 28, 2018

    Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
    06:46

    Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

    Published on: August 25, 2016

    Area of Science:

    • Optical Physics
    • Metrology

    Background:

    • Ellipsometry is a powerful optical technique for characterizing thin films and surfaces.
    • Accurate calibration of ellipsometer components, such as divided circles, is crucial for reliable measurements.
    • Existing calibration methods may not fully account for system variations or provide sufficient precision.

    Purpose of the Study:

    • To develop and compare two in-process calibration methods for ellipsometer divided circles.
    • To determine azimuth angle corrections for polarizer, compensator, and analyzer components.
    • To assess the accuracy and applicability of the proposed calibration methods.

    Main Methods:

    • Implementation of a residual method for calibration.
    • Application of a nonlinear least-squares estimation procedure for calibration.
    • Utilizing multiple measurements on arbitrary specimens for azimuth angle correction computation.

    Main Results:

    • Confidence limits on calibration constants are often underestimated.
    • Both methods provide consistent calibration constants within experimental uncertainty.
    • Calibration constants can exhibit wavelength dependency.
    • A fixed-polarizer nulling scheme with post-reflection compensator setting maximizes accuracy.

    Conclusions:

    • The developed methods offer reliable in-process calibration for ellipsometers.
    • Understanding wavelength dependency and optimizing system configurations are key for high-accuracy ellipsometry.
    • The choice between calibration methods may depend on specific data characteristics.