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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
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Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

Published on: April 13, 2016

X-ray applications of self-scanning silicon diode arrays

R D Bleach, D J Nagel

    Applied Optics
    |February 20, 2010
    PubMed

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