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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
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Holographic interferometry: identification of hot spots in a high density circuit board

P C Gupta, A K Aggarwal, V N Shukla

    Applied Optics
    |February 20, 2010
    PubMed
    Abstract

    No abstract available in PubMed .

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