Electrical properties and memory effects of field-effect transistors from networks of single- and double-walled

Antonio Di Bartolomeo1, Mohamed Rinzan, Anthony K Boyd

  • 1Dipartimento di Fisica E R Caianiello and Centro Interdipartimentale di Ricerca NANOMATES, Università di Salerno, 84084 Fisciano (Sa), Italy. dibant@sa.infn.it

Nanotechnology
|February 23, 2010
PubMed