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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Refractive indices of ir materials: 10.6-microm ellipsometer measurements
Applied Optics
|February 23, 2010
Abstract:
10.6-microm ellipsometric measurements, using a modulated light ellipsometer, are reported for the refractive imdies of KCL, CdTe, and ZnSe crystals and for ZnSe and ThF(4) films.
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