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Resonant internal-reflection prism spectroscopy using surface, guided, and Fabry-Perot EM waves.

A Hjortsberg, W P Chen, E Burstein

|February 23, 2010

Summary

Resonant electromagnetic modes in prisms act as powerful probes for surfaces and thin films. This technique enhances electromagnetic fields, enabling detailed optical constant analysis.

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Area of Science:

Optics and Photonics
Surface Science
Spectroscopy

Background:

Electromagnetic (EM) modes in multi-medium prism configurations are crucial for surface analysis.
Existing methods may lack sensitivity for thin film optical properties.

Purpose of the Study:

To discuss resonant EM modes in three-media prisms.
To demonstrate their application as EM probes for surfaces, interfaces, and thin films.
To highlight the spectroscopic capabilities for determining optical constants.

Main Methods:

Utilizing resonant internal reflection (RIR) within prism configurations.
Exciting surface EM, guided EM, and Fabry-Perot EM modes.
Analyzing the buildup of EM fields at resonant frequencies.

Main Results:

Demonstrated the excitation of various resonant EM modes.
Showcased the significant EM field enhancement at resonant conditions.
Confirmed the ability to obtain optical constants of surfaces and thin overlayers.

Conclusions:

Resonant EM modes in prisms offer a powerful spectroscopic tool.
RIR excitation provides detailed information on optical constants.
The method benefits from field enhancement and wavevector/frequency matching.