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Updated: Jun 16, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Gallium arsenide laser-array-on-silicon package

J D Crow, L D Comerford, J S Harper

    Applied Optics
    |February 23, 2010
    PubMed

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