Atomic Emission Spectroscopy: Lab
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
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Updated: Jun 15, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
J G Alessi1, D Barton, E Beebe
1Collider-Accelerator Department, Brookhaven National Laboratory, Upton, New York 11973, USA.
A new electron beam ion source (EBIS) is complete, designed for high-current ion beams for heavy ion research and space radiation studies. This advanced EBIS utilizes a superconducting solenoid and sophisticated vacuum systems for optimal performance.
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